Verification of timed circuits with failure-directed abstractions Journal Article uri icon

Overview

publication date

  • March 1, 2006

Date in CU Experts

  • October 28, 2020 2:57 AM

Full Author List

  • Zheng H; Myers CJ; Walter D; Little S; Yoneda T

author count

  • 5

citation count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 0278-0070

Electronic International Standard Serial Number (EISSN)

  • 1937-4151

Additional Document Info

start page

  • 403

end page

  • 412

volume

  • 25

issue

  • 3