Timed circuit verification using TEL structures Journal Article

Overview

CU Boulder Authors

• Myers, Christopher

publication date

• January 1, 2001

has restriction

• closed

Date in CU Experts

• October 28, 2020 2:58 AM

Full Author List

• Belluomini W; Myers CJ; Hofstee HP

author count

• 3

citation count

• 12

published in

• IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems  Journal

Other Profiles

International Standard Serial Number (ISSN)

• 0278-0070

Electronic International Standard Serial Number (EISSN)

• 1937-4151

Digital Object Identifier (DOI)

• https://doi.org/10.1109/43.905681

Additional Document Info

start page

• 129

end page

• 146

volume

• 20

issue

• 1