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INSITU SURFACE X-RAY-SCATTERING MEASUREMENTS OF ELECTROCHEMICALLY DEPOSITED BI ON AG(111) - STRUCTURE, COMPRESSIBILITY, AND COMPARISON WITH EXSITU LOW-ENERGY ELECTRON-DIFFRACTION MEASUREMENTS
Journal Article
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Additional Document Info
Overview
publication date
April 1, 1991
has restriction
closed
Date in CU Experts
November 5, 2020 2:39 AM
Full Author List
TONEY MF; GORDON JG; SAMANT MG; BORGES GL; WIESLER DG; YEE D; SORENSEN LB
author count
7
citation count
52
published in
Langmuir
Journal
Other Profiles
International Standard Serial Number (ISSN)
0743-7463
Digital Object Identifier (DOI)
https://doi.org/10.1021/la00052a031
Additional Document Info
start page
796
end page
802
volume
7
issue
4