INSITU SURFACE X-RAY-SCATTERING MEASUREMENTS OF ELECTROCHEMICALLY DEPOSITED BI ON AG(111) - STRUCTURE, COMPRESSIBILITY, AND COMPARISON WITH EXSITU LOW-ENERGY ELECTRON-DIFFRACTION MEASUREMENTS Journal Article uri icon

Overview

publication date

  • April 1, 1991

has restriction

  • closed

Date in CU Experts

  • November 5, 2020 2:39 AM

Full Author List

  • TONEY MF; GORDON JG; SAMANT MG; BORGES GL; WIESLER DG; YEE D; SORENSEN LB

author count

  • 7

citation count

  • 52

Other Profiles

International Standard Serial Number (ISSN)

  • 0743-7463

Additional Document Info

start page

  • 796

end page

  • 802

volume

  • 7

issue

  • 4