Improvements in Silicon Oxide Dielectric Loss for Superconducting Microwave Detector Circuits Journal Article uri icon

Overview

publication date

  • June 1, 2013

Date in CU Experts

  • September 6, 2013 3:45 AM

Full Author List

  • Li D; Gao J; Austermann JE; Beall JA; Becker D; Cho H-M; Fox AE; Halverson N; Henning J; Hilton GC

author count

  • 15

citation count

  • 9

Other Profiles

International Standard Serial Number (ISSN)

  • 1051-8223

Electronic International Standard Serial Number (EISSN)

  • 1558-2515

Additional Document Info

volume

  • 23

issue

  • 3

number

  • ARTN 1501204