The Extreme Ultraviolet Sensor (EUVS) for GOES-R Conference Proceeding
Overview
publication date
- August 20, 2009
Date in CU Experts
- January 3, 2021 9:37 AM
Full Author List
- Eparvier FG; Crotser D; Jones AR; McClintock WE; Snow M; Woods TN
Full Editor List
- Fineschi S; Fennelly JA
author count
- 6
published in
- Proceedings of SPIE Journal
presented at event
- SPIE Optical Engineering + Applications Conference
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X