The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement Journal Article uri icon

Overview

abstract

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

publication date

  • August 1, 2013

has restriction

  • bronze

Date in CU Experts

  • January 8, 2021 9:28 AM

Full Author List

  • Yazdi S; Kasama T; Beleggia M; Ciechonski R; Kryliouk O; Wagner JB

author count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 1431-9276

Electronic International Standard Serial Number (EISSN)

  • 1435-8115

Additional Document Info

start page

  • 1502

end page

  • 1503

volume

  • 19

issue

  • S2