Towards Mapping Electrostatic Potentials in Semiconductor Devices Under Working Conditions Using Off-Axis Electron Holography Journal Article uri icon

Overview

abstract

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

publication date

  • August 1, 2013

Full Author List

  • Yazdi S; Kasama T; McComb DW; Harrison AC; Dunin-Borkowski RE

Other Profiles

Additional Document Info

start page

  • 1358

end page

  • 1359

volume

  • 19

issue

  • S2