Enhancing Electrical Conductivity of Semiconducting MOFs via Defect Healing Journal Article uri icon

Overview

publication date

  • September 14, 2021

has restriction

  • closed

Date in CU Experts

  • September 28, 2021 1:37 AM

Full Author List

  • Choi JY; Park J

author count

  • 2

citation count

  • 1

Other Profiles

Electronic International Standard Serial Number (EISSN)

  • 2637-6113

Additional Document Info

start page

  • 4197

end page

  • 4202

volume

  • 3

issue

  • 9