Multiscale modeling of seepage-induced suffusion and slope failure using a coupled FEM-DEM approach Journal Article uri icon

Overview

publication date

  • August 1, 2022

has restriction

  • closed

Date in CU Experts

  • August 16, 2022 8:18 AM

Full Author List

  • Hu Z; Yang ZX; Guo N; Zhang YD

author count

  • 4

Other Profiles

International Standard Serial Number (ISSN)

  • 0045-7825

Electronic International Standard Serial Number (EISSN)

  • 1879-2138

Additional Document Info

volume

  • 398

number

  • ARTN 115177