Radiation Testing a Very Low-Noise RHBD ASIC Electrometer
Conference Proceeding
Overview
publication date
- July 20, 2010
has restriction
- closed
Date in CU Experts
- November 17, 2022 8:20 AM
Full Author List
- Jones AR; O'Connor D; Thiemann E; Drake VA; Newcomb G; White N; Aalami DD; Clark HL; Ladbury RL; von Przewoski B
author count
- 17
presented at event
- 2010 Radiation Effects Data Workshop Conference
Other Profiles
Digital Object Identifier (DOI)
Additional Document Info
start page
- 6
end page
- 6