Enhanced Electron Mobility Due to Dopant-Defect Pairing in Conductive ZnMgO Journal Article
Overview
publication date
- May 1, 2014
has restriction
- closed
Date in CU Experts
- March 29, 2023 11:42 AM
Full Author List
- Ke Y; Lany S; Berry JJ; Perkins JD; Parilla PA; Zakutayev A; Ohno T; O'Hayre R; Ginley DS
author count
- 9
citation count
- 47
published in
- Advanced Functional Materials Journal
Other Profiles
International Standard Serial Number (ISSN)
- 1616-301X
Electronic International Standard Serial Number (EISSN)
- 1616-3028
Digital Object Identifier (DOI)
Additional Document Info
start page
- 2875
end page
- 2882
volume
- 24
issue
- 19