Enhanced Electron Mobility Due to Dopant-Defect Pairing in Conductive ZnMgO Journal Article uri icon

Overview

publication date

  • May 1, 2014

has restriction

  • closed

Date in CU Experts

  • March 29, 2023 11:42 AM

Full Author List

  • Ke Y; Lany S; Berry JJ; Perkins JD; Parilla PA; Zakutayev A; Ohno T; O'Hayre R; Ginley DS

author count

  • 9

citation count

  • 47

Other Profiles

International Standard Serial Number (ISSN)

  • 1616-301X

Electronic International Standard Serial Number (EISSN)

  • 1616-3028

Additional Document Info

start page

  • 2875

end page

  • 2882

volume

  • 24

issue

  • 19