Mechanisms of Electron-Beam-Induced Damage in Perovskite Thin Films Revealed by Cathodoluminescence Spectroscopy Journal Article uri icon

Overview

publication date

  • December 3, 2015

has restriction

  • closed

Date in CU Experts

  • March 29, 2023 11:42 AM

Full Author List

  • Xiao C; Li Z; Guthrey H; Moseley J; Yang Y; Wozny S; Moutinho H; To B; Berry JJ; Gorman B

author count

  • 13

citation count

  • 147

Other Profiles

International Standard Serial Number (ISSN)

  • 1932-7447

Additional Document Info

start page

  • 26904

end page

  • 26911

volume

  • 119

issue

  • 48