Lesion Durability for Atrial Fibrillation Ablation Using Voltage and LSI: An LSI Workflow Sub-Study Conference Proceeding uri icon

Overview

publication date

  • February 2, 2023

Date in CU Experts

  • February 28, 2024 9:07 AM

Full Author List

  • Gilge J; Prasad KV; Bonso A; Woods C; Goya M; Seiichiro M; Padanilam B; Kreis I; Yang F; Williams C

author count

  • 14

citation count

  • 0

Other Profiles

International Standard Serial Number (ISSN)

  • 1045-3873

Electronic International Standard Serial Number (EISSN)

  • 1540-8167

Additional Document Info

start page

  • 1069

end page

  • 1069

volume

  • 34

issue

  • 4