Research Note—Using Expectation Disconfirmation Theory and Polynomial Modeling to Understand Trust in Technology Journal Article uri icon

Overview

abstract

  • Trust in technology is an emerging research domain that examines trust in the technology artifact instead of trust in people. Although previous research finds that trust in technology can predict important outcomes, little research has examined the effect of unmet trust in technology expectations on trusting intentions. Furthermore, both trust and expectation disconfirmation theories suggest that trust disconfirmation effects may be more complex than the linear expectation disconfirmation model depicts. However, this complexity may only exist under certain contextual conditions. The current study contributes to this literature by introducing a nonlinear expectation disconfirmation theory model that extends understanding of trust-in-technology expectations and disconfirmation. Not only does the model include both technology trust expectations and technology trusting intention, it also introduces the concept of expectation maturity as a contextual factor. We collected data from three technology usage contexts that differ in expectation maturity, which we operationalize as length of the introductory period. We find that the situation, in terms of expectation maturity, consistently matters. Using polynomial regression and response surface analyses, we find that in contexts with a longer introductory period (i.e., higher expectation maturity), disconfirmation has a nonlinear relationship with trusting intention. When the introductory period is shorter (i.e., expectation maturity is lower), disconfirmation has a linear relationship with trusting intention. This unique set of empirical findings shows when it is valuable to use nonlinear modeling for understanding technology trust disconfirmation. We conclude with implications for future research.

publication date

  • March 1, 2016

has restriction

  • closed

Date in CU Experts

  • December 4, 2024 3:52 AM

Full Author List

  • Lankton NK; McKnight DH; Wright RT; Thatcher JB

author count

  • 4

Other Profiles

International Standard Serial Number (ISSN)

  • 1047-7047

Electronic International Standard Serial Number (EISSN)

  • 1526-5536

Additional Document Info

start page

  • 197

end page

  • 213

volume

  • 27

issue

  • 1