Bistatic Radar Tomography of Shear Margins: Simulated Temperature and Basal Material Inversions Journal Article uri icon

Overview

publication date

  • January 1, 2023

Date in CU Experts

  • January 28, 2025 11:49 AM

Full Author List

  • Bienert N; Schroeder DM; Summers P

author count

  • 3

Other Profiles

International Standard Serial Number (ISSN)

  • 0196-2892

Electronic International Standard Serial Number (EISSN)

  • 1558-0644

Additional Document Info

start page

  • 1

end page

  • 16

volume

  • 61