High spectral-resolution interferometry down to 1 micron with Asgard/BIFROST at VLTI: Science drivers and project overview
Conference Proceeding
Overview
publication date
- July 17, 2022
Date in CU Experts
- July 2, 2026 11:46 AM
Full Author List
- Kraus S; Mortimer D; Chhabra S; Lu Y; Codron I; Gardner T; Anugu N; Monnier JD; Le Bouquin J-B; Ireland M
Full Editor List
- Merand A; Sallum S; Sanchez-Bermudez J
author count
- 13
citation count
- 6
published in
- Proceedings of SPIE Journal
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X
Electronic International Standard Serial Number (EISSN)
- 1996-756X
Digital Object Identifier (DOI)
International Standard Book Number (ISBN) 13
- 978-1-5106-5347-4
Additional Document Info
volume
- 12183