Foveated wavelet image quality index
Conference Proceeding
Overview
publication date
- July 31, 2001
Date in CU Experts
- July 2, 2026 6:36 AM
Full Author List
- Wang Z; Bovik AC; Lu L; Kouloheris J
Full Editor List
- Tescher AG
author count
- 4
citation count
- 28
published in
- Proceedings of SPIE Journal
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X
Electronic International Standard Serial Number (EISSN)
- 1996-756X
Digital Object Identifier (DOI)
International Standard Book Number (ISBN) 10
- 0-8194-4186-4
Additional Document Info
start page
- 42
end page
- 52
volume
- 4472