Analytic model of parasitic capacitance attenuation in CMOS devices with hyper-thin oxides Journal Article uri icon

Overview

publication date

  • September 28, 2000

Date in CU Experts

  • December 11, 2013 9:59 AM

Full Author List

  • Ahmed K; Ibok E; Hauser J

author count

  • 3

citation count

  • 4

Other Profiles

International Standard Serial Number (ISSN)

  • 0013-5194

Electronic International Standard Serial Number (EISSN)

  • 1350-911X

Additional Document Info

start page

  • 1699

end page

  • 1700

volume

  • 36

issue

  • 20