Limitations of the modified shift-and-ratio technique for extraction of the bias dependence of L-eff and R-sd of LDD MOSFET's Journal Article uri icon

Overview

publication date

  • April 1, 2000

Date in CU Experts

  • December 11, 2013 10:00 AM

Full Author List

  • Ahmed K; De I; Osburn C; Wortman J; Hauser J

author count

  • 5

citation count

  • 4

Other Profiles

International Standard Serial Number (ISSN)

  • 0018-9383

Additional Document Info

start page

  • 891

end page

  • 895

volume

  • 47

issue

  • 4