MEMS Packaging and Reliability Chapter uri icon

Overview

publication date

  • January 1, 2007

Date in CU Experts

  • December 17, 2013 12:58 PM

Full Author List

  • LEE Y

Full Editor List

  • Suhir E; Lee Y-C; Wong CP

author count

  • 1

book title

  • Micro- and opto-electronic materials and structures: physics, mechanics, design, reliability, packaging

Other Profiles

International Standard Book Number (ISBN) 10

  • 0387279741

International Standard Book Number (ISBN) 13

  • 9780387279749