MEMS Packaging and Reliability Chapter

Overview

CU Boulder Authors

• Lee, Y. C.

publication date

• January 1, 2007

Date in CU Experts

• December 17, 2013 12:58 PM

Full Author List

• LEE Y

Full Editor List

• Suhir E; Lee Y-C; Wong CP

author count

• 1

Other Profiles

International Standard Book Number (ISBN) 10

• 0387279741

International Standard Book Number (ISBN) 13

• 9780387279749