Scaled GaAs MESFET's with gate length down to 100 nm Journal Article

Overview

CU Boulder Authors

• Van Zeghbroeck, Bart

publication date

• September 1, 1986

has restriction

• closed

Date in CU Experts

• April 17, 2014 3:09 AM

Full Author List

• Jaeckel H; Graf V; Van Zeghbroeck BJ; Vettiger P; Wolf P

author count

• 5

published in

• IEEE Electron Device Letters  Journal

Other Profiles

International Standard Serial Number (ISSN)

• 0741-3106

Digital Object Identifier (DOI)

• https://doi.org/10.1109/edl.1986.26459

Additional Document Info

start page

• 522

end page

• 524

volume

• 7

issue

• 9