Tolerance and precision study for solder self-assembled MEMS Conference Proceeding uri icon

Overview

publication date

  • May 22, 2000

Date in CU Experts

  • May 28, 2014 4:03 AM

Full Author List

  • Harsh KF; Kladitis PE; Zhang YH; Dunn ML; Bright VM; Lee YC

Full Editor List

  • Syms RRA

author count

  • 6

citation count

  • 3

Other Profiles

International Standard Serial Number (ISSN)

  • 0277-786X

International Standard Book Number (ISBN) 10

  • 0-8194-3712-3

Additional Document Info

start page

  • 173

end page

  • 191

volume

  • 4075