Tolerance and precision study for solder self-assembled MEMS Conference Proceeding

Overview

CU Boulder Authors

• Bright, Victor Mark

publication date

• May 22, 2000

Date in CU Experts

• May 28, 2014 4:03 AM

Full Author List

• Harsh KF; Kladitis PE; Zhang YH; Dunn ML; Bright VM; Lee YC

Full Editor List

• Syms RRA

author count

• 6

citation count

• 3

published in

• Proceedings of SPIE  Journal

presented at event

• Conference on Micro-Opto-Electro-Mechanical Systems  Conference

Other Profiles

International Standard Serial Number (ISSN)

• 0277-786X

Digital Object Identifier (DOI)

• 10.1117/12.397933

International Standard Book Number (ISBN) 10

• 0-8194-3712-3

Additional Document Info

start page

• 173

end page

• 191

volume

• 4075