A Comparison of ILC Architectures for Nanopositioners with Applications to AFM Raster Tracking Conference Proceeding

Overview

CU Boulder Authors

Pao, Lucy Y

publication date

June 29, 2011

Date in CU Experts

May 28, 2014 4:40 AM

Full Author List

Butterworth JA; Pao LY; Abramovitch DY

author count

3

citation count

7

published in

Proceedings of the ... American Control Conference. American Control Conference Journal

presented at event

American Control Conference (ACC) Conference

Other Profiles

International Standard Serial Number (ISSN)

0743-1619

Electronic International Standard Serial Number (EISSN)

2378-5861