A Comparison of ILC Architectures for Nanopositioners with Applications to AFM Raster Tracking Conference Proceeding uri icon

Overview

publication date

  • June 29, 2011

Date in CU Experts

  • May 28, 2014 4:40 AM

Full Author List

  • Butterworth JA; Pao LY; Abramovitch DY

author count

  • 3

citation count

  • 4

Other Profiles

International Standard Serial Number (ISSN)

  • 0743-1619

Electronic International Standard Serial Number (EISSN)

  • 2378-5861