Modeling and Metrology of Metallic Nanowires with Application to Microwave Interconnects Conference Proceeding uri icon


publication date

  • January 1, 2010

Date in CU Experts

  • May 28, 2014 5:27 AM

Full Author List

  • Kim K; Wallis M; Rise P; Chiang C; Imtiaz A; Kabos P; Filipovic DS; IEEE

author count

  • 8

Other Profiles

International Standard Serial Number (ISSN)

  • 0149-645X

International Standard Book Number (ISBN) 13

  • 978-1-4244-6057-1