Modeling and Metrology of Metallic Nanowires with Application to Microwave Interconnects Conference Proceeding
Overview
publication date
- January 1, 2010
Date in CU Experts
- May 28, 2014 5:27 AM
Full Author List
- Kim K; Wallis M; Rise P; Chiang C; Imtiaz A; Kabos P; Filipovic DS; IEEE
author count
- 8
published in
Other Profiles
International Standard Serial Number (ISSN)
- 0149-645X
International Standard Book Number (ISBN) 13
- 978-1-4244-6057-1