Galvanic corrosion: A microsystems device integrity and reliability concern Conference Proceeding uri icon

Overview

publication date

  • January 25, 2006

Date in CU Experts

  • May 28, 2014 5:28 AM

Full Author List

  • Miller DC; Hughes WL; Wang ZL; Gall K; Stoldt CR

Full Editor List

  • Tanner DM; Ramesham R

author count

  • 5

citation count

  • 1

Other Profiles

International Standard Serial Number (ISSN)

  • 0277-786X

Electronic International Standard Serial Number (EISSN)

  • 1996-756X

International Standard Book Number (ISBN) 10

  • 0-8194-6153-9

Additional Document Info

volume

  • 6111