Hierarchical Porous Framework of Si-Based Electrodes for Minimal Volumetric Expansion Journal Article uri icon

Overview

publication date

  • June 4, 2014

has restriction

  • closed

Date in CU Experts

  • July 25, 2014 3:49 AM

Full Author List

  • Piper DM; Woo JH; Son S-B; Kim SC; Oh KH; Lee S-H

author count

  • 6

citation count

  • 45

Other Profiles

International Standard Serial Number (ISSN)

  • 0935-9648

Electronic International Standard Serial Number (EISSN)

  • 1521-4095

Additional Document Info

start page

  • 3520

end page

  • 3525

volume

  • 26

issue

  • 21