Channel cracks in atomic-layer and molecular-layer deposited multilayer thin film coatings Journal Article uri icon

Overview

publication date

  • June 21, 2014

Date in CU Experts

  • August 21, 2014 4:11 AM

Full Author List

  • Long R; Dunn ML

author count

  • 2

citation count

  • 10

Other Profiles

International Standard Serial Number (ISSN)

  • 0021-8979

Electronic International Standard Serial Number (EISSN)

  • 1089-7550

Additional Document Info

volume

  • 115

issue

  • 23

number

  • ARTN 233514