Electrochemically induced and orientation dependent crack propagation in single crystal silicon Journal Article
Overview
publication date
- December 1, 2014
has restriction
- closed
Date in CU Experts
- September 10, 2014 3:35 AM
Full Author List
- Kang CS; Son S-B; Kim JW; Kim SC; Choi YS; Heo JY; Suh S-S; Kim Y-U; Chu YY; Cho JS
author count
- 12
citation count
- 23
published in
Other Profiles
International Standard Serial Number (ISSN)
- 0378-7753
Electronic International Standard Serial Number (EISSN)
- 1873-2755
Digital Object Identifier (DOI)
Additional Document Info
start page
- 739
end page
- 743
volume
- 267