Organization of liquid crystals on submicron scale topographic patterns with fourfold symmetry prepared by thiolene photopolymerization-based nanoimprint lithography Journal Article

Overview

CU Boulder Authors

publication date

May 1, 2008

has restriction

closed

Date in CU Experts

September 3, 2013 12:21 PM

Full Author List

Yi YW; Khire V; Bowman CN; Maclennan JE; Clark NA

author count

5

citation count

30

published in

Journal of Applied Physics Journal

Other Profiles

International Standard Serial Number (ISSN)

0021-8979

Electronic International Standard Serial Number (EISSN)

1089-7550

Digital Object Identifier (DOI)

https://doi.org/10.1063/1.2913317

Additional Document Info

volume

103

issue

9

number

ARTN 093518