Organization of liquid crystals on submicron scale topographic patterns with fourfold symmetry prepared by thiolene photopolymerization-based nanoimprint lithography Journal Article uri icon

Overview

publication date

  • May 1, 2008

Date in CU Experts

  • September 3, 2013 12:21 PM

Full Author List

  • Yi YW; Khire V; Bowman CN; Maclennan JE; Clark NA

author count

  • 5

citation count

  • 30

Other Profiles

International Standard Serial Number (ISSN)

  • 0021-8979

Electronic International Standard Serial Number (EISSN)

  • 1089-7550

Additional Document Info

volume

  • 103

issue

  • 9

number

  • ARTN 093518