Impact of low-dose electron irradiation on n(+) p silicon strip sensors Journal Article uri icon

Overview

publication date

  • December 11, 2015

has restriction

  • hybrid

Date in CU Experts

  • November 19, 2015 3:20 AM

Full Author List

  • Adam W; Bergauer T; Dragicevic M; Fried M; Fruehwirth R; Hoch M; Hrubec J; Krammer M; Treberspurg W; Waltenberger W

author count

  • 659

citation count

  • 8

Other Profiles

International Standard Serial Number (ISSN)

  • 0168-9002

Electronic International Standard Serial Number (EISSN)

  • 1872-9576

Additional Document Info

start page

  • 100

end page

  • 112

volume

  • 803