Harnessing snap-through instability in soft dielectrics to achieve giant voltage-triggered deformation Journal Article uri icon

Overview

publication date

  • January 1, 2012

Date in CU Experts

  • January 26, 2016 3:11 AM

Full Author List

  • Keplinger C; Li T; Baumgartner R; Suo Z; Bauer S

author count

  • 5

citation count

  • 323

Other Profiles

International Standard Serial Number (ISSN)

  • 1744-683X

Electronic International Standard Serial Number (EISSN)

  • 1744-6848

Additional Document Info

start page

  • 285

end page

  • 288

volume

  • 8

issue

  • 2