Die cracking at solder (NO-PNO) joints on brittle (GaAs) chips: Fracture correlation using critical bimaterial interface corner stress intensities Journal Article uri icon

Overview

publication date

  • September 1, 2003

Full Author List

  • Su BZ; Lee YC; Dunn ML

Other Profiles

Additional Document Info

start page

  • 369

end page

  • 377

volume

  • 125

issue

  • 3