Design of patterned multilayer films with eigenstrains by topology optimization Journal Article uri icon

Overview

publication date

  • March 1, 2006

Date in CU Experts

  • September 3, 2013 12:44 PM

Full Author List

  • Pajot JM; Maute K; Zhang YH; Dunn ML

author count

  • 4

citation count

  • 15

Other Profiles

International Standard Serial Number (ISSN)

  • 0020-7683

Electronic International Standard Serial Number (EISSN)

  • 1879-2146

Additional Document Info

start page

  • 1832

end page

  • 1853

volume

  • 43

issue

  • 6