Radiation tolerance of 65 nm CMOS transistors Journal Article uri icon

Overview

publication date

  • December 1, 2015

Date in CU Experts

  • March 4, 2016 2:10 AM

Full Author List

  • Krohn M; Bentele B; Christian DC; Cumalat JP; Deptuch G; Fahim F; Hoff J; Shenai A; Wagner SR

author count

  • 9

citation count

  • 6

Other Profiles

International Standard Serial Number (ISSN)

  • 1748-0221

Additional Document Info

volume

  • 10

number

  • ARTN P12007