Probabilistic distributions of pinhole defects in atomic layer deposited films on polymeric substrates Journal Article uri icon

Overview

publication date

  • January 1, 2016

has restriction

  • bronze

Date in CU Experts

  • June 1, 2016 9:45 AM

Full Author List

  • Yersak AS; Lee Y-C

author count

  • 2

citation count

  • 7

Other Profiles

International Standard Serial Number (ISSN)

  • 0734-2101

Electronic International Standard Serial Number (EISSN)

  • 1520-8559

Additional Document Info

volume

  • 34

issue

  • 1

number

  • ARTN 01A149