Reliable characterization of materials and nanostructured systems << 50nm using coherent EUV beams Conference Proceeding uri icon


publication date

  • February 22, 2016

has restriction

  • closed

Date in CU Experts

  • July 13, 2016 4:08 AM

Full Author List

  • Hernandez-Charpak J; Frazer T; Knobloch J; Hoogeboom-Pot K; Nardi D; Chao W; Jiang L; Tripp M; King S; Kapteyn H

Full Editor List

  • Sanchez MI; Ukraintsev VA

author count

  • 11

Other Profiles

International Standard Serial Number (ISSN)

  • 0277-786X

Additional Document Info


  • 9778