Reliable characterization of materials and nanostructured systems << 50nm using coherent EUV beams Conference Proceeding uri icon

Overview

publication date

  • February 22, 2016

Date in CU Experts

  • July 13, 2016 4:08 AM

Full Author List

  • Hernandez-Charpak J; Frazer T; Knobloch J; Hoogeboom-Pot K; Nardi D; Chao W; Jiang L; Tripp M; King S; Kapteyn H

Full Editor List

  • Sanchez MI; Ukraintsev VA

author count

  • 11

Other Profiles

International Standard Serial Number (ISSN)

  • 0277-786X

Additional Document Info

volume

  • 9778