The Role of Examiner Workload and Applicant Reputation in Intellectual Property Protection Journal Article uri icon

Overview

publication date

  • January 1, 2013

Date in CU Experts

  • May 24, 2017 12:57 PM

Full Author List

  • Chaffin DT; Heidl RA; Chari M; Calantone R

author count

  • 4

Other Profiles

International Standard Serial Number (ISSN)

  • 0065-0668

Electronic International Standard Serial Number (EISSN)

  • 2151-6561

Additional Document Info

start page

  • 17346

end page

  • 17346

volume

  • 2013

issue

  • 1