Thermal shock resistance of silicon nitrides using an indentation-quench test Journal Article uri icon

Overview

publication date

  • January 1, 2002

Date in CU Experts

  • October 27, 2017 2:57 AM

Full Author List

  • Lee SK; Moretti JD; Readey MJ; Lawn BR

author count

  • 4

citation count

  • 27

Other Profiles

International Standard Serial Number (ISSN)

  • 0002-7820

Electronic International Standard Serial Number (EISSN)

  • 1551-2916

Additional Document Info

start page

  • 279

end page

  • 281

volume

  • 85

issue

  • 1