Finite width effect of thin-films buckling on compliant substrate: Experimental and theoretical studies Journal Article uri icon

Overview

publication date

  • August 1, 2008

Date in CU Experts

  • September 3, 2013 3:13 AM

Full Author List

  • Jiang H; Khang D-Y; Fei H; Kim H; Huang Y; Xiao J; Rogers JA

author count

  • 7

citation count

  • 91

Other Profiles

International Standard Serial Number (ISSN)

  • 0022-5096

Electronic International Standard Serial Number (EISSN)

  • 1873-4782

Additional Document Info

start page

  • 2585

end page

  • 2598

volume

  • 56

issue

  • 8