Defect tolerance and nanomechanics in transistors that use semiconductor nanomaterials and ultrathin dielectrics Journal Article uri icon

Overview

publication date

  • September 10, 2008

has restriction

  • green

Date in CU Experts

  • September 3, 2013 3:13 AM

Full Author List

  • Ahn J-H; Zhu Z; Park S-I; Xiao J; Huang Y; Rogers JA

author count

  • 6

citation count

  • 5

Other Profiles

International Standard Serial Number (ISSN)

  • 1616-301X

Electronic International Standard Serial Number (EISSN)

  • 1616-3028

Additional Document Info

start page

  • 2535

end page

  • 2540

volume

  • 18

issue

  • 17