EVALUATION OF TIGHT-BINDING MODELS FOR DEEP DEFECT LEVELS IN SEMICONDUCTORS Journal Article uri icon

Overview

publication date

  • January 1, 1982

Full Author List

  • SINGH VA; LINDEFELT U; ZUNGER A

Other Profiles

Additional Document Info

start page

  • 2781

end page

  • 2785

volume

  • 25

issue

  • 4