Strain-induced interfacial hole localization in self-assembled quantum dots: Compressive InAs/GaAs versus tensile InAs/InSb Journal Article uri icon

Overview

publication date

  • December 1, 2004

Date in CU Experts

  • September 3, 2013 3:28 AM

Full Author List

  • He LX; Bester G; Zunger A

author count

  • 3

citation count

  • 46

Other Profiles

International Standard Serial Number (ISSN)

  • 2469-9950

Electronic International Standard Serial Number (EISSN)

  • 2469-9969

Additional Document Info

volume

  • 70

issue

  • 23

number

  • ARTN 235316