Origins of the doping asymmetry in oxides: Hole doping in NiO versus electron doping in ZnO Journal Article uri icon

Overview

publication date

  • June 1, 2007

Date in CU Experts

  • September 3, 2013 3:29 AM

Full Author List

  • Lany S; Osorio-Guillen J; Zunger A

author count

  • 3

citation count

  • 164

Other Profiles

International Standard Serial Number (ISSN)

  • 2469-9950

Electronic International Standard Serial Number (EISSN)

  • 2469-9969

Additional Document Info

volume

  • 75

issue

  • 24

number

  • ARTN 241203