ELECTRONIC-STRUCTURE OF SUBSTITUTIONAL CHALCOGEN IMPURITIES IN SILICON Journal Article uri icon

Overview

publication date

  • January 1, 1983

has restriction

  • closed

Date in CU Experts

  • September 3, 2013 3:29 AM

Full Author List

  • SINGH VA; LINDEFELT U; ZUNGER A

author count

  • 3

citation count

  • 41

Other Profiles

International Standard Serial Number (ISSN)

  • 2469-9950

Electronic International Standard Serial Number (EISSN)

  • 2469-9969

Additional Document Info

start page

  • 4909

end page

  • 4923

volume

  • 27

issue

  • 8