Substrate Biasing Effects in a High-Voltage, Monolithically-Integrated Half-Bridge GaN-Chip Conference Proceeding uri icon

Overview

publication date

  • October 30, 2017

Date in CU Experts

  • January 31, 2018 3:45 AM

Full Author List

  • Weiss B; Reiner R; Polyakov V; Waltereit P; Quay R; Ambacher O; Maksimovic D

author count

  • 7

citation count

  • 29

Additional Document Info

start page

  • 265

end page

  • 272