Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV Curve and Complex Admittance Measurements Conference Proceeding uri icon

Overview

publication date

  • July 17, 2017

Date in CU Experts

  • November 8, 2018 12:24 PM

Full Author List

  • Zhou Y; Ambarish CV; Gruenke R; Jaeckel FT; Kripps KL; McCammon D; Morgan KM; Wulf D; Zhang S; Adams JS

author count

  • 26

citation count

  • 3

Other Profiles

International Standard Serial Number (ISSN)

  • 0022-2291

Electronic International Standard Serial Number (EISSN)

  • 1573-7357

Additional Document Info

start page

  • 321

end page

  • 327

volume

  • 193

issue

  • 3-4