Electrochemically induced fractures in-crystalline silicon anodes Journal Article uri icon

Overview

publication date

  • June 15, 2019

has restriction

  • green

Date in CU Experts

  • November 6, 2019 3:05 AM

Full Author List

  • Yoon T; Xiao C; Liu J; Wang Y; Son S; Burrell A; Ban C

author count

  • 7

citation count

  • 10

Other Profiles

International Standard Serial Number (ISSN)

  • 0378-7753

Electronic International Standard Serial Number (EISSN)

  • 1873-2755

Additional Document Info

start page

  • 44

end page

  • 49

volume

  • 425