Experimental study and theoretical prediction of aging induced frequency shift of crystal resonators and oscillators Journal Article
Overview
publication date
- December 1, 2003
has restriction
- closed
Date in CU Experts
- September 6, 2013 12:16 PM
Full Author List
- Roh YS; Asiz A; Zhang WP; Xi Y
author count
- 4
citation count
- 5
published in
- Microelectronics Reliability Journal
Other Profiles
International Standard Serial Number (ISSN)
- 0026-2714
Digital Object Identifier (DOI)
Additional Document Info
start page
- 1993
end page
- 2000
volume
- 43
issue
- 12