Field and temperature dependence of thermally activated flux flow resistance in Tl2Ba2CaCu2O8 thin films Journal Article uri icon

Overview

publication date

  • July 15, 2005

has restriction

  • closed

Date in CU Experts

  • November 14, 2019 9:49 AM

Full Author List

  • Lu XF; Gao H; Wang Z; Zhang YZ; Shan L; Lu RT; Yan SL; Wen HH

author count

  • 8

citation count

  • 5

Other Profiles

International Standard Serial Number (ISSN)

  • 0921-4534

Electronic International Standard Serial Number (EISSN)

  • 1873-2143

Additional Document Info

start page

  • 175

end page

  • 180

volume

  • 423

issue

  • 3-4