Impedance Sensing Integrated Directly into a Power Amplifier Output Matching Network Conference Proceeding

Overview

CU Boulder Authors

Barton, Taylor Wallis

publication date

June 2, 2019

has restriction

closed

Date in CU Experts

December 3, 2019 5:21 AM

Full Author List

Donahue D; de Falco P; Barton T

author count

3

citation count

6

published in

IEEE MTT-S International Microwave Symposium digest. IEEE MTT-S International Microwave Symposium Journal

presented at event

IEEE-MTT-S International Microwave Symposium (IMS) Conference

Other Profiles

International Standard Serial Number (ISSN)

0149-645X

Electronic International Standard Serial Number (EISSN)

2576-7216

Digital Object Identifier (DOI)

https://doi.org/10.1109/mwsym.2019.8700868

Additional Document Info

start page

983

end page

986